Precision optical measurement (including optical interferometry, digital holographic microscopy, deflectometry)

Computational imaging (including super-resolution microscopy, compressed sensing and denoising, deep learning)

Metrology of complex surfaces (including characterisation of freeform and structured surfaces, multi-scale analysis, and standardisation)

ISO TC213 Member; National Standardisation Committee TC240 Member; Senior Member of SPIE and the Chinese Optical Society; Council Member of the Shanghai Inertial Technology Society; Committee Member of the Precision Mechanical Branch and of the Integrated-Circuit Measurement and Instrumentation Branch of the Chinese Society for Scientific Instruments; Committee Member of the Visual Inspection Committee of the China Society for Imaging Science and Technology; Project Review Expert for the National Natural Science Foundation of China and the UK EPSRC; Editorial Board Member of Surface Topography: Metrology and Properties, Optical Precision Engineering, and other journals.

2024 "Optical Inspection Technology" recognised as Shanghai First-Class Undergraduate Course

2023 Second Prize, Science and Technology Progress Award, Chinese Society for Optical Engineering

2023 Third Prize, 10th National Optoelectronic Design Contest for College Students; First Prize, East China Region — mentor

2023 Fudan University Rui-Jun Teaching Award

2023 Grand Prize, 3rd Fudan University Teaching Innovation Competition

2023 Dean's Award, College of Information Science and Engineering, Fudan University

2022 Fudan University Rui-Jun Teaching Award

2022 Gold Medal, Geneva International Exhibition of Inventions

2021 Best Paper Award, 10th International Symposium on Precision Mechanical Measurement

2021 "Outstanding Team" Award for Joint Prevention and Control, College of Information Science and Engineering, Fudan University

2020 Most Impact Award, IFOSA International Conference

2019 SPIE Senior Member

2018 Mentor, Third Prize, National Optoelectronic Design Contest for College Students

2018 Outstanding Reviewer, Measurement

2016 Second Prize, Science and Technology Progress Award, Ministry of Education (third contributor)

2016 Outstanding Project Completion, NSFC — invited keynote at the project closing meeting

2015 Outstanding Class Mentor, Tengfei Residential College, Fudan University

2014 Outstanding Class Mentor, Tengfei Residential College, Fudan University

2013 Second-Prize Teaching Award, Fudan University

June 2025 – present

December 2022 – present

Optoelectronic Science and Engineering Teaching and Research Section

College of Future Information Technology, Fudan University

Deputy Head

Researcher

April 2018 – present

Shanghai Engineering Technology Centre for Ultra-Precision Optical Manufacturing

Deputy Director

December 2011 – December 2022

Department of Optical Science and Engineering, Fudan University

Associate Researcher

July 2009 – September 2011

Centre for Precision Technology, University of Huddersfield, UK

Research Fellow

September 2005 – June 2009

Centre for Precision Technology, University of Huddersfield, UK

PhD student

September 2001 – July 2005

University of Science and Technology of China

Undergraduate

Undergraduate courses: Linear Algebra; Optical Inspection Technology; Applied Optics; Methods of Mathematical Physics.

Y Chen, W Lang, T Chen, X Niu, X Zhang*. Enhancing the efficiency and determinacy of in-situ monoscopic phase measuring deflectometry by Bayesian approach. Precision Engineering 2025;94:693-699

W Lang, X Zhang*, Y Chen, T Chen, P Yang, M Xu, X Jiang. Deterministic form-position deflectometric measurement of monolithic multi-freeform optical structures via Bayesian multisensor fusion. Light: Advanced Manufacturing 2025;6:29

X Zhang*, X Ma, S Rong. Physics-informed and self-supervised multi-image super-resolution reconstruction for digital holography microscopy. Surface Topography: Metrology and Properties 2025;13:015034

Z Hua , X Zhang, D Tu , X Zhang. Three-dimensional topography measurement for confocal microscopy with arrayed laser spots. IEEE Transactions on Instrumentation and Measurement 2025;74:5024816

P Yang, T Chen, D Wang, L Ye, Y Chen , W Lang, X Zhang*. Recognition and separation of fringe patterns in deflectometric measurement of transparent elements based on empirical curvelet transform. Measurement 2024;237(1):115242

T Chen, P Yang , W Lang, Y Chen, W Wang, X Zhang*. Integrated form-position measurement of large-aperture transparent elements based on stereoscopic phase measuring deflectometry. Surface Topography: Metrology and Properties 2024; 12:025023

T Chen, P Yang, X Zhang * , W Lang, Y Chen, M Xu. Separation of fringe patterns in fast deflectometric measurement of transparent optical elements based on neural network-assisted fast iterative filtering method. Advances in Manufacturing 2024; s40436-024-00509-w

R Xiong, X Zhang*, X Ma, L Li, Z Ni, X Jiang. Adaptive coded phase mask design and high-quality image reconstruction for interference-less coded aperture correlation holography. Optics Express 2024;32(7):12747-12762

Y Chen, X Zhang*, W Lang, T Chen, Z Hu, X Jiang. Simplifying the monoscopic deflectometric measurement by extra-facility-free workpiece positioning. Precision Engineering 2024;87:97-105

W Lang, X Zhang*, Y Chen, T Chen and X Jiang. Holistic calibration method of deflectometry by holonomic framework priors. Optics Letters 2024;49(3):702-705

Q Lu, W Gong, Y Sun, W Wang, X Zhang, P Wang, Y Ding, W Wang*, S Liu, X Zhang, M Xu, J Shao.Fast, intelligent and high-precision adaptive interferometry for optical freeform surfaces by backpropagation. Optics Express 2024;32(2):2658-2669

T Chen, Y Chen, W Lang, X Zhang, W Wang*, M Xu. In-situ sub-aperture stitching measurement based on monoscopic phase measuring deflectometry. Precision Engineering 2024;85(1):197-204

C Wang, W Wang, J Wei, J Wu, X Zhang, H Zheng, F Wang, Y Yu. A phase-based reconstruction optimization method for digital holographic measurement of microstructures. Applied Optics 2023;62(17): 4530-4535

W Lang, X Zhang*, Y Chen, T Chen, Z Hu and X Jiang. A general reconstruction framework for deflectometric measurement based on non-uniform B-splines. IEEE Transactions on Instrumentation and Measurement 2023;72(5): 5015511

Z Hu, X Zhang*, W Lang, Y Chen, T Chen and M Xu. Fast measurement of surface topographies using a phase-measuring deflectometric microscopy. IEEE Photonics Journal 2023;15(2):6800807

J Wang, L Peng, F Zhai, D Tang*, F Gao, X Zhang*, R Chen, L Zhou* and X Jiang. Polarized angle-resolved spectral reflectometry for real-time ultra-thin film. Optics Express 2023;31(4):6552-6565

X Zhang*, H Yuan, R Xiong, J Wang*, X Ma, Z Hu and M Xu. Fast measurement of surface defects on large components with dynamic phase-shifting digital holographic microscopy. Measurement 2023;208(1):112443

R Xiong, X Zhang*, X Ma, L Li, J Wang* and X Jiang. Full-dimensional surface characterization based on polarized coherent coded aperture correlation holography. IEEE Photonics Journal 2022;14(6):3160407

K Wang,YQ Zhu , QC An, XC Zhang, C Peng, HR Meng and XY Liu. An even sampling photonic-integrated interferometric array for synthetic aperture imaging. Optics Express 2022;30(18):32119-32128

F Wang, X Zhang*, R Xiong, X Ma, and X Jiang. Depth multiplexing of orbital angular momentum holography. Optics Express 2022;30(18):31863-31871

Z Niu, Z Wu, S Wan, X Zhang*, C Wei*, J Shao. Iterative space-variant sphere-model deflectometry enabling designation-model-free measurement of the freeform surface. Optics Express 2022;30(9):14019-14032

F Wang, X Zhang*, R Xiong, X Ma, and X Jiang. Angular multiplexation of partial helical phase modes in orbital angular momentum holography. Optics Express 2022;30(7):11110-11119

T Chen, Y Chen, X Zhang, W Wang*, M Xu. Workpiece positioning and error decoupling in the single-point diamond turning of freeform mirrors based on the monoscopic deflectometry. Precision Engineering 2022;77(1):16–23

Y Chen, X Zhang*, T Chen, R Zhu, L Ye, W Lang. Transition imaging phase measuring deflectometry for high-precision measurement of optical surfaces. Measurement 2022;199(1):111589

X Zhao, Y Chen, Z Guo, Y Zhou, J GuoZ Liu, X Zhang, L Xiao, Y Fei, X Wu. Tunable optofluidic microbubble lens. Optics Express 2022;30(5):8317-8329